A New TEM Is Coming To CAM.

A new JEOL 1400 Flash Transmission Electron Microscope (TEM) will be coming to the Center for Advanced (CAM) in the next few months. This new TEM will replace the JEOL 100CX TEM that has served MSU researchers for the past 34 years


The new JEOL 1400 Flash is at the cutting edge of technology with some very exciting and useful features.

The microscope will be equipped with a newly developed Matataki Flash sCMOS camera that dramatically reduces readout noise (less than 0.9 electrons) while maintaining an extremely high frame rate of 30 frames per second. The camera facilitates another feature, the automated Limitless Panorama Function (automated stitching) that can cover a wide area with no limitation on the number of pixels.

In addition, the microscope has an Optical Microscope Correlation function in which an image from an optical microscope can be imported and overlaid on a TEM image to facilitate correlative microscopy.

The microscope has an easy to use intuitive user interface that should facilitate teaching in NSC-810 and research use.

The lattice resolution is excellent, 0.2 nm using a High Contrast Pole Piece! This resolution will provide outstanding results on all biological samples and will be useful for many physical science TEM users.

The microscope will be equipped with a four grid holder, and all sample holders will be interchangeable between the JEOL 1400 and the other TEM at CAM, the JEOL 2200FS. The stage on the new TEM will be capable of plus or minus 70 degree tilts.

This new microscope represents a major advancement in the TEM capabilities at the Center for Advanced Microscopy and will benefit many MSU researchers and numerous off-campus users.

A Keyence VHX-6000 Digital Microscope Has Arrived At CAM.

A Keyence VHX-6000 microscope is now available at the Center for Advanced Microscopy. This remarkable microscope is the latest development in the field of Digital Microscopy (DM). It makes extensive use of recent breakthroughs in digital cameras, stage micro-motors, advanced zoom lenses, graphics engines, and software.

The microscope takes full Color Images at magnifications from approximately 1X to 5,000X with full Depth-of-Field using the concept of Focus Stacking (Z focus series). The imaging process uses software controlled stage motors and is done automatically. Sample Surface Profiles and 3D information can also be collected. Samples require no processing.

The microscope complements the SEM and CLSM capabilities at CAM. Instruction on the microscope is being incorporated into the SEM class (NSC-820) and the CLSM class (NSC-837). The charges for use of the microscope are posted on the Services page. A Web Page with full information about the microscope will be posted in the near future.

SEM and TEM Photos of the Giant Samba Virus taken at CAM Make the April Cover of Viruses.

Colorized SEM and TEM photos taken at CAM were used for the cover of the April issue of Viruses. The photos are from research being conducted by Kristin Parent and Jason Schrad from the Department of Biochemistry and Molecular Biology.

The images were taken using cryo electron microscopy and ultra-high resolution scanning electron microscopy. Kristin was instrumental in bringing the technique of cryo electron microscopy to Michigan State University.


An SEM Photo from CAM Makes the April Cover of Microbial Cell.

A colorized SEM photo taken at CAM was used for the cover of the April issue of Microbial Cell.  The photo is from research by James Kremer and shows the bacterial pathogen Pseudomonas syringae on the leaf of Arabidiopsis thaliana.

James is finishing his Ph.D. (Plant Research Laboratory and Microbiology and Molecular Genetics;  Sheng-Yang He and James Tiedje, co-advisors) and now works for AgBiome, Research Triangle Park, North Carolina.

CAM User Thomas Pinnavaia Honored as an AAAS Fellow.

Thomas Pinnavaia, a user of CAM for many years, was recently named an AAAS Fellow by the American Association for the Advancement of Science. The award was made “For distinguished contributions to the field of inorganic materials chemistry, particularly for innovative synthesis of mesophases via supramolecular assembly and the intercalation of lamellar solids.” We extend our congratulations to Tom.

Other CAM users named as AAAS Fellows in the past include Christoph Benning, Dean Della-Penna, Shelagh Ferguson-Miller, Sheng-Yang He, Ken Keegstra, R. James Kirkpatrick, Richard Lenski, Katherine Osteryoung, Danny Schnell, Thomas Sharkey, Michael Thomashow, James Tiedje, and Jonathan Walton.

A New Nikon C2+ Confocal Laser Scanning Microscope (CLSM) Has Arrived At CAM.

A new Nikon C2+ confocal laser scanning microscope (CLSM) has arrived at CAM.  The new microscope will be used for teaching the NSC-837 class (Confocal Laser Scanning Microscopy Lab) and for research.  The new microscope has the upright configuration that is useful in the examination of stained sections and certain materials science samples.  In addition, it has three photomultiplier (PMT) detectors, four lasers, a color camera, and uses filter cubes rather than filter wheels.  The microscope is currently undergoing installation and testing which will be followed by operator training.  It is anticipated the microscope will be available for users by Sept. 2.  The new Nikon C2+ will replace the Zeiss Pascal CLSM that has been at CAM for the last 14 years.

CAM Will Host a Super Resolution and TIRF Microscopy Seminar June 8.

Nikon Super Resolution (STORM) and TIRF Seminar, Monday June 8, 2015, 11:30 a.m. to 12:30 p.m., Room 162 Food Safety and Toxicology Bldg., 1129 Farm Lane, East Lansing, MI 48824.  Presentation by Mike Kerber, Applications Specialist with Nikon Instruments.

Mike Kerber, Applications Specialist with Nikon Instruments, will visit the MSU Center for Advanced Microscopy (CAM) June 8th – 10th.

During his visit, Mike will provide a seminar on Monday June 8 to discuss the basic theory and research applications for both TIRF and STORM and will be available to work directly with MSU researchers on these applications.

Both TIRF and STORM are now available on the new Nikon A1Rsi Confocal Laser Scanning Microscope that has been installed within the MSU Center for Advanced Microscopy.

TIRF (Total Internal Reflection Fluorescence) is a laser-based microscopy technique that selectively detects fluorescence labels within 100 nm of the coverslip.  The technique exhibits an extremely low background signal, allowing researchers to image fluorescent samples with very high contrast.

STORM (Stochastic Optical Reconstruction Microscopy) is a super resolution microscopy technique that is capable of spatial imaging at optical resolutions as low as 20 nm within fixed cells.

Everyone is invited to attend the seminar on Monday June 8.  If you would like to schedule additional time to meet with Mike and discuss your specific applications, please contact Dr. Melinda Frame, framem@msu.edu.