A Keyence VHX-6000 microscope is now available at the Center for Advanced Microscopy. This remarkable microscope is the latest development in the field of Digital Microscopy (DM). It makes extensive use of recent breakthroughs in digital cameras, stage micro-motors, advanced zoom lenses, graphics engines, and software.
The microscope takes full Color Images at magnifications from approximately 1X to 5,000X with full Depth-of-Field using the concept of Focus Stacking (Z focus series). The imaging process uses software controlled stage motors and is done automatically. Sample Surface Profiles and 3D information can also be collected. Samples require no processing.
The microscope complements the SEM and CLSM capabilities at CAM. Instruction on the microscope is being incorporated into the SEM class (NSC-820) and the CLSM class (NSC-837). The charges for use of the microscope are posted on the Services page. A Web Page with full information about the microscope will be posted in the near future.
A colorized SEM photo taken at CAM was used for the cover of the April issue of Microbial Cell. The photo is from research by James Kremer and shows the bacterial pathogen Pseudomonas syringae on the leaf of Arabidiopsis thaliana.
James is finishing his Ph.D. (Plant Research Laboratory and Microbiology and Molecular Genetics; Sheng-Yang He and James Tiedje, co-advisors) and now works for AgBiome, Research Triangle Park, North Carolina.
Thomas Pinnavaia, a user of CAM for many years, was recently named an AAAS Fellow by the American Association for the Advancement of Science. The award was made “For distinguished contributions to the field of inorganic materials chemistry, particularly for innovative synthesis of mesophases via supramolecular assembly and the intercalation of lamellar solids.” We extend our congratulations to Tom.
Other CAM users named as AAAS Fellows in the past include Christoph Benning, Dean Della-Penna, Shelagh Ferguson-Miller, Sheng-Yang He, Ken Keegstra, R. James Kirkpatrick, Richard Lenski, Katherine Osteryoung, Danny Schnell, Thomas Sharkey, Michael Thomashow, James Tiedje, and Jonathan Walton.
A new Nikon C2+ confocal laser scanning microscope (CLSM) has arrived at CAM. The new microscope will be used for teaching the NSC-837 class (Confocal Laser Scanning Microscopy Lab) and for research. The new microscope has the upright configuration that is useful in the examination of stained sections and certain materials science samples. In addition, it has three photomultiplier (PMT) detectors, four lasers, a color camera, and uses filter cubes rather than filter wheels. The microscope is currently undergoing installation and testing which will be followed by operator training. It is anticipated the microscope will be available for users by Sept. 2. The new Nikon C2+ will replace the Zeiss Pascal CLSM that has been at CAM for the last 14 years.
SEM images take by James Kremer and Carol Flegler appeared in the June 16 edition of MSU Today Science News. The SEM was used to assist Kremer and colleagues, Sheng-Yang He and James Tiedje in their quest to understand the interaction between microbes and plants.
Nikon Super Resolution (STORM) and TIRF Seminar, Monday June 8, 2015, 11:30 a.m. to 12:30 p.m., Room 162 Food Safety and Toxicology Bldg., 1129 Farm Lane, East Lansing, MI 48824. Presentation by Mike Kerber, Applications Specialist with Nikon Instruments.
Mike Kerber, Applications Specialist with Nikon Instruments, will visit the MSU Center for Advanced Microscopy (CAM) June 8th – 10th.
During his visit, Mike will provide a seminar on Monday June 8 to discuss the basic theory and research applications for both TIRF and STORM and will be available to work directly with MSU researchers on these applications.
TIRF (Total Internal Reflection Fluorescence) is a laser-based microscopy technique that selectively detects fluorescence labels within 100 nm of the coverslip. The technique exhibits an extremely low background signal, allowing researchers to image fluorescent samples with very high contrast.
STORM (Stochastic Optical Reconstruction Microscopy) is a super resolution microscopy technique that is capable of spatial imaging at optical resolutions as low as 20 nm within fixed cells.
Everyone is invited to attend the seminar on Monday June 8. If you would like to schedule additional time to meet with Mike and discuss your specific applications, please contact Dr. Melinda Frame, firstname.lastname@example.org.
A new Nikon A1Rsi Super Resolution CLSM has arrived at CAM. This advanced microscope has significant improvements in speed and sensitivity that facilitate live cell imaging. The microscope has TIRF (total internal reflectance fluorescence) capability that selectively detects fluorescence labels within 100 nm of the coverslip. In addition the microscope has STORM super resolution capability that allows resolution of 20 nm on fixed cells. The microscope is currently undergoing installation and testing which will be followed by operator training. It is anticipated the microscope will be available for users by June 1.
Adam Brown, Associate Professor, Department of Art, Art History, and Design, will display some of his work at the Eli Broad Art Museum during the period of Feb. 20 to March 29. Adam merges the worlds of art and science in some very special ways. One of his recent projects used the JEOL 7500F scanning electron microscope at CAM in his work on gold reducing bacteria. He was able to see individual isolated particles of gold on the bacterial cells using backscattered electron imaging and energy dispersive X-ray microanalysis. The JEOL 7500F SEM, the highest resolution SEM in the State of Michigan, was ideal for this analysis. For an excellent video presentation of the techniques he uses, including video of him using the SEM, please go to:http://vimeo.com/46660836. More information may be found at: http://adamwbrown.net/