Nikon Super Resolution (STORM) and TIRF Seminar, Monday June 8, 2015, 11:30 a.m. to 12:30 p.m., Room 162 Food Safety and Toxicology Bldg., 1129 Farm Lane, East Lansing, MI 48824. Presentation by Mike Kerber, Applications Specialist with Nikon Instruments.
Mike Kerber, Applications Specialist with Nikon Instruments, will visit the MSU Center for Advanced Microscopy (CAM) June 8th – 10th.
During his visit, Mike will provide a seminar on Monday June 8 to discuss the basic theory and research applications for both TIRF and STORM and will be available to work directly with MSU researchers on these applications.
Both TIRF and STORM are now available on the new Nikon A1Rsi Confocal Laser Scanning Microscope that has been installed within the MSU Center for Advanced Microscopy.
TIRF (Total Internal Reflection Fluorescence) is a laser-based microscopy technique that selectively detects fluorescence labels within 100 nm of the coverslip. The technique exhibits an extremely low background signal, allowing researchers to image fluorescent samples with very high contrast.
STORM (Stochastic Optical Reconstruction Microscopy) is a super resolution microscopy technique that is capable of spatial imaging at optical resolutions as low as 20 nm within fixed cells.
Everyone is invited to attend the seminar on Monday June 8. If you would like to schedule additional time to meet with Mike and discuss your specific applications, please contact Dr. Melinda Frame, firstname.lastname@example.org.