There
are two Scanning Electron Microscopes at the Center for Advanced Microscopy,
a JEOL
6400V
(Japan Electron Optics Laboratories) with
a LaB6 emitter (Noran EDS) and a JEOL
6300F with field emission
(Oxford EDS). We offer the following services:
- Secondary Electron
Imaging.
- Backscattered Electron
Imaging
- Digital Imaging
- Analog Imaging
- Energy Dispersive
X-ray Microanalysis (EDS)
Service
and User charges
Additional equipment
available:
- Critical point dryer, Balzers CPD
- Gold spitter coater, (EMSCOPE SC500
Sputter coater, Ashford, Kent, Great Britain)
- Pure osmium coater (NEOC-AN, MEIWA
SHOJI CO. LTD, JAPAN)
- Carbon string evaporator (EFFA MkII
Carbon Coater , Ernest F. Fullam Inc., Latham, NY)
